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Shanghai Alpha Meijia Biotechnology Co., Ltd
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Shanghai Alpha Meijia Biotechnology Co., Ltd

  • メール

    marketing@alpharmaca.com

  • 電話番号

    18964508029

  • アドレス

    Caohejing Pujiang High tech Park, Minhang District, Shanghai, China

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Production of Nano Laser Particle Size Analyzer

ネゴシエーション可能更新03/13
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概要

The Zeta potential and particle size analyzer is an upgraded version of the classic model 380ZLS, which uses the Dynamic Light Scattering (DLS) principle to detect and analyze the particle size distribution of particles, and the same machine uses the Doppler Electrophoretic Light Scattering (DELS) principle to detect the ZETA potential.

製品詳細

Nicomp® 3000
Nano laser particle size analyzer

Dynamic light scattering instrument

Zeta电位与粒径分析仪(奥法)

With a history of over 50 years
Specially designed for complex systemsProvide high-precision granularity analysis solutions
Help you explore the subtle mysteries of the nano universe!

0.9 ° Step Multi Angle (MADLS) true multi angle module

Nanoparticles with different particle sizes, especially those with particle sizes much smaller than the laser wavelength, may lose some details in the force distribution (PSD) under traditional dynamic light scattering theory. Entegris(PSS)Nicomp ® The 3000 series is innovatively equipped with a multi angle module that can range from 14.4 ° to 180 ° with a step size of 0.9 °. Suitable angles can be selected for detecting special samples (such as extremely small particle sizes), significantly improving the resolution of complex systems.

Zeta电位与粒径分析仪(奥法)Zeta电位与粒径分析仪(奥法)

Reusable direct insertion target level reduces consumable costs

The Zeta potential detection module uses dual in-line target electrodes, which are easy to clean and can be reused repeatedly. Not only does it protect the environment, but it also greatly reduces the cost of using disposable electrode modules.

Zeta电位与粒径分析仪(奥法)

Exclusive Nicomp ® Multi peak distribution, capable of distinguishing multiple components with a ratio of 1:2

Entegris(PSS)Nicomp ® The 3000 series is equipped with Nicomp ® The multimodal algorithm can effectively distinguish different particle sizes (1:2 different components), providing a powerful production tool for complex and multi-component systems.

(The following figure shows the samples of the same complex system under Gaussian algorithm and Nicomp algorithm, respectively.) ® The results presented by the algorithm

Zeta电位与粒径分析仪(奥法)

Zeta电位与粒径分析仪(奥法)

Gaussian particle size distribution diagram

Zeta电位与粒径分析仪(奥法)

Nicomp ® Multi peak particle size distribution diagram


Automatic dilution module and automatic injection module reduce trial and error costs and manual errors

Entegris(PSS)Nicomp ® The 3000 series applies automatic dilution module and automatic injection module in dynamic light scattering method, which can effectively avoid the trial and error cost and error caused by manual dilution, and also achieve automated detection operation, providing a good solution for large-scale detection.

Zeta电位与粒径分析仪(奥法) Zeta电位与粒径分析仪(奥法)

Product Introduction
PRODUCT INTRODUCTION

Nicomp ® Z3000 nanoparticle size and ZETA potential analyzer

Testing Scope

Particle size detection: 0.3nm-10.0 μ m

Zeta potential: -500mV -+500mV

Application field

pharmaceutical field Proteins, viruses, liposomes, emulsions, micelles, nanocrystals, vaccines, nanocarriers, cells, etc
chemical engineering field Ink, pigments, polymer materials, chemical dyes, lubricants, petrochemicals, quantum, etc
semiconductor field Photoresist CMP slurry、 Resin, etc
other Food, beverages, cosmetics, etc

Zeta电位与粒径分析仪(奥法)

MINI DLS online nano laser particle size analyzer/online dynamic light scattering analyzer

particle size range 20nm-2μm*
concentration 0.1-10wt%
repetitiveness ±5%
detector PMT (Photomultiplier Tube)
Laser wavelength accuracy ±10%
detection angle 90°

No calibration needed
*hydrodynamic radius, Hydrodynamic radius

Application field

Particle size control downstream of homogenizer/grinder
Production monitoring of nano formulation products such as liposomes and emulsions
Wear monitoring of CMP slurry (grinding fluid)
nanoadvancedParticle size monitoring during material production process

Zeta电位与粒径分析仪(奥法)

Instrument principle
PRINCIPLE

Schematic diagram of the principle of Dynamic Light Scattering method

Zeta电位与粒径分析仪(奥法) Zeta电位与粒径分析仪(奥法)

Schematic diagram of Zeta potential working principle

Zeta potential is used to test the repulsive force between particles and is a measurement method to determine the stability of the system.

One important characteristic of Brownian motion is that small particles move quickly while large particles move slowly. Due to the continuous movement of particles, the scattered light spot will also move. Due to the movement of particles, the phase superposition of scattered light will cause the bright and dark areas to increase and decrease in intensity or be expressed in another way, and the intensity will also fluctuate. Namely, the Brownian motion of particles causes fluctuations in light intensity.

Zeta电位与粒径分析仪(奥法) Zeta电位与粒径分析仪(奥法)

By using Laplace inverse transformation, the optical signal is converted into an exponential spectrum for data processing, and the chaotic fluctuation curve is transformed into a regular autocorrelation C (t) function curve.

Obtain the decay constant τ through the autocorrelation C (t) function curve, and obtain the diffusion coefficient D through the following disclosure;

1/τ=2DK2 (K is the scattered light wave vector, which is a constant)

Finally, by using the Stokes Einstein equation, the particle size R:

Zeta电位与粒径分析仪(奥法)

In the formula:
K=Boltzmann constant;
T =absolutetemperature
H=shear viscosity of the solution;
R=radius of particle size;
D=diffusion coefficient;

Zeta电位与粒径分析仪(奥法)

Nicomp ® Schematic diagram of 3000 series equipment testing

Nicomp ® The 3000 series nano laser particle size analyzer uses the principle of dynamic light scattering to detect and analyze the particle size distribution of samples. Detection of ZETA potential based on Doppler Electrophoretic Light Scattering (ELS) principle. It is mainly used for detecting systems at the nanometer and micrometer levels, with a particle size detection range of 0.3nm-10 μ m and a ZETA potential detection range of ± 500mV. The dynamic light scattering method (DLS) separates from traditional light scattering theory and focuses on small particles in the Rayleigh scattering region, mainly used for detecting dispersed systems at the nanometer level. Dynamic light scattering obtains the autocorrelation function through the fluctuation of light intensity values, thereby obtaining the decay time constant τ, and then calculating the diffusion velocity D (Diffusion Coefficient) of the particles. By substituting it into the Stokes Einstein equation, the radius of the particles can be calculated.

Zeta potential measurement:Nicomp ® The Z3000 combines dynamic light scattering technology (DLS) and electrophoretic light scattering (ELS) to achieve simultaneous testing of submicron particle distribution and ZETA potential. ELS is a new type of light scattering that combines electrophoresis and light scattering. Its light scattering theory is based on the quasi elastic collision theory. In the experiment, an external electric field is applied to the sample slot, and the charged particles will move towards the electrode direction opposite to the charged particles at a fixed speed. The corresponding dynamic light scattering spectrum produces Doppler shift, which is proportional to the movement speed of the charged particles. Therefore, the electrophoretic velocity of the charged particles can be obtained from the drift of the spectral lines measured in the experiment, and the potential value can be obtained. One of the measurement methods to determine the stability of a system by testing the repulsive force between particles.

Zeta电位与粒径分析仪(奥法)

Zeta电位与粒径分析仪(奥法)

Phase analysis method (PALS):Replacing the original spectral drift with phase change analysis not only significantly improves the accuracy and stability of Zeta potential analysis, but also breaks through the limitations of aqueous phase systems, providing accurate analysis of Zeta potential for organic phase systems.

Product advantages
PRODUCT HIGHLIGHT

0.9 ° Step Multi Angle (MADLS) true multi angle module

Nanoparticles with different particle sizes, especially those with particle sizes much smaller than the laser wavelength, may lose some details in the force distribution (PSD) under traditional dynamic light scattering theory. Entegris(PSS)Nicomp ® The 3000 series is innovatively equipped with a multi angle module that can range from 14.4 ° to 180 ° with a step size of 0.9 °. Suitable angles can be selected for detecting special samples (such as extremely small particle sizes), significantly improving the resolution of complex systems.

Zeta电位与粒径分析仪(奥法)

Exclusive Nicomp ® Multi peak distribution, capable of distinguishing multiple components with a ratio of 1:2

Entegris(PSS)Nicomp ® The 3000 series is equipped with Nicomp ® The multimodal algorithm can effectively distinguish different particle sizes (1:2 different components), providing a powerful production tool for complex and multi-component systems.
(The following figure shows the samples of the same complex system under Gaussian algorithm and Nicomp algorithm, respectively.) ® The results presented by the algorithm

Zeta电位与粒径分析仪(奥法)

Gaussian particle size distribution diagram

Zeta电位与粒径分析仪(奥法)

Nicomp ® Multi peak particle size distribution diagram

Ultra high resolution nanometer detection accuracy

Through testing of protein samples, Nicomp ® The nano laser particle size analyzer still displays ultra-high resolution and accuracy for particles smaller than 10nm. Nicomp ® The ultra-high resolution of the nanolaser particle size analyzer can effectively help researchers detect sample particle size distribution more accurately and realistically.

As shown in the figure below, the particle size of the protein monomer is 1.7nm

Zeta电位与粒径分析仪(奥法)

The theoretical particle size of protein dimer is twice that of 1.7nm and 3.4nm. Nicomp ® The result obtained from the 3000 series measurement is around 2.9nm. This value is consistent with the actual particle size.

Zeta电位与粒径分析仪(奥法)

For more complex tetramers, their theoretical particle size is 4 times that of monomers at 6.8nm. Nicomp ® The result obtained from the 3000 series measurement is 5.7nm. This value is consistent with the actual particle size.

Zeta电位与粒径分析仪(奥法)

Zeta电位与粒径分析仪(奥法)

By overlaying the above three data points, we can clearly see that three peaks with very small differences in particle size can still be obtained below 10nm, indicating Nicomp ® The 3000 series instruments have ultra-high resolution and sensitivity.

Automatic dilution module and automatic injection module reduce trial and error costs and manual errors

Entegris(PSS)Nicomp ® The 3000 series applies automatic dilution module and automatic injection module in dynamic light scattering method, which can effectively avoid the trial and error cost and error caused by manual dilution, and also achieve automated detection operation, providing a good solution for large-scale detection.

Zeta电位与粒径分析仪(奥法)

Multiple sample trays available

3×7 samples-30mm tube(50mL)
4×10 samples-20mm tube(20mL)
5×12 samples-16mm tube(14mL)
6×15 samples-13mm tube(7mL)

Reusable direct insertion target level reduces consumable costs

The Zeta potential detection module uses dual in-line target electrodes, which are easy to clean and can be reused repeatedly. Not only does it protect the environment, but it also greatly reduces the cost of using disposable electrode modules.

PMT&APD dual detector

Entegris(PSS)Nicomp ® The 3000 series can be equipped with high-sensitivity photomultiplier tube detectors and avalanche diode detectors, which have 7-10 times amplification gain compared to traditional photomultiplier tubes.

Software Workstation
SOFTWARE WORKSTATION

Comprehensive permission management

Flexibly set user management permissions to increase security. Password complexity, automatic logout time, password modification time limit can be set to meet CSV computer system verification.

Zeta电位与粒径分析仪(奥法)

1. User management
2. Allow editing of sample testing methods
3. Database management
4. Link driver
4. Allow users to measure samples with instruments
5. Update firmware in the host (with engineer privileges)
6. Password permission settings
7. Can view, output, and change the automatic backup location of data
8. Change and recalculate test data
9. Import Curve
10. Curve calibration (not open to users)
11. Increase or decrease report templates
12. Allow printing or exporting reports
13. Delete sample data (not visible only on the software interface, database data still exists and can be restored)
14. Delete sample data
15. Delete Report
16. Delete Files

Complete audit trail

It has detailed audit tracking records, supports log export and printing, records all operations during user login, and can be retrieved based on operation type, time, project, etc.

Zeta电位与粒径分析仪(奥法)

Multiple data backup methods

Data backup supports manual and automatic backup to file paths. The backup content includes complete data content, operation methods, audit trail logs, etc.

Zeta电位与粒径分析仪(奥法)

Software testing interface

Concise and clear, supports real-time switching between different weights and analysis models, and can quickly query different indicators.

Zeta电位与粒径分析仪(奥法)

instrument parameters
INSTRUMENT SPECIFICATION

Nicomp ® Z3000 Nano Particle Size and Zeta Potential Analyzer
configuration Standard Pro Plus Ultimate
temperature range 0 ° C~90 ° C (± 0.1 ° C temperature control accuracy, no condensation)
laser light source solid-state laser
laser power 15mW 35mW 35mW 35mW
PH value range 1~14
granularity
analytical method Dynamic light scattering, Gaussian distribution, and Nicomp multimodal distribution
Testing Scope 0.3nm~10μm
Minimum sample size 10μL
maximumconcentration 40%w/v
measure angle 90° 90° Multi angle (14.4 °~180 °, including 90 °, with a step of 0.9 °)
molecular weight 342-2*107 Da
zeta potential
analytical method Electrophoretic Light Scattering (ELS), Doppler Spectral Analysis/Phase Analysis
Testing Scope 0.3nm~10μm
Minimum sample size ±500mV
Maximum concentration 40%w/v
measure angle -14.9°
molecular weight 342-2*107 Da
attachment
detector PMT (Photomultiplier Tube) PMT (photomultiplier tube)&APD (avalanche diode)
sample pool
Research version software
Dual in-line target electrode
21 CFR Part 11 Software
Multi angle detection module / /
Automatic sampling module / / /
Automatic dilution module / / /
size 56cm*4lcm*24cm
weight About 26kg (configuration related)

Note: Actual samples shall prevail Standard configuration, included with the box Optional, purchase separately